Donor-related deep levels in In1-xGaxAsyP1-y

被引:0
作者
Kwon, HK
Kwon, SD
Lim, H
Choe, BD
机构
[1] Ajou Univ, Dept Elect Engn, Suwon 441749, South Korea
[2] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
关键词
DX center; deep donor level; capture barrier; deep-level transient spectroscopy; persistent photoconductivity; thermally stimulated capacitance; charge-state controlled stability;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Donor-related deep levels in In1-xGaxP and In1-xGaxAsyP1-y grown on the lattice-matched substrates are reviewed. The S-, Se-, and Te-doped samples show the characteristic deep levels corresponding to the donor species. They are revealed to have the same properties as the well-known DX center in AlGaAs - persistent photoconductivity, variation of thermally stimulated capacitance, constancy of activation energy with alloying, bandstructure-dependent deep level density. It is concluded that the S, Se, and Te donors form DX centers in In1-xGaxP and In1-xGaxAsyP1-y. Furthermore: the origin and the peculiar property of deep levels observed in undoped In0.5Ga0.5P and In1-xGaxAsyP1-y, respectively, are also reviewed.
引用
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页码:83 / 102
页数:20
相关论文
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