CMOS temperature sensor with ring oscillator for mobile DRAM self-refresh control

被引:19
作者
Kim, Chan-Kyung [1 ,2 ]
Lee, Jae-Goo [1 ]
Jun, Young-Hyun [1 ]
Lee, Chil-Gee [2 ]
Kong, Bai-Sun [2 ]
机构
[1] Samsung Elect Co Ltd, Memory Div, DRAM Design Team, Semicond Business, Hwasung 445701, Kyeonggi Do, South Korea
[2] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
关键词
bandgap reference; temperature sensor; DRAM self-refresh control; ring oscillator;
D O I
10.1016/j.mejo.2007.08.003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents novel low-cost CMOS temperature sensor for controlling the self-refresh period of a mobile DRAM. In the proposed temperature sensor, the temperature dependency of poly resistance is used to generate a temperature-dependent bias current, and a ring oscillator driven by this bias current is employed to obtain the digital code pertaining to on-chip temperature. This method is highly area-efficient, simple and easy for IC implementation as compared to traditional temperature sensors based on bandgap reference. The proposed CMOS temperature sensor was fabricated with an 80 nm 3-metal DRAM process, which occupies extremely small silicon area of only about 0.0 16 mm(2) with under 1 mu W power consumption for providing 0.7 degrees C effective resolution at 1 sample/s processing rate. This result indicates that as much as 73% area reduction was obtained with improved resolution as compared to the conventional temperature sensor in mobile DRAM. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1042 / 1049
页数:8
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