A study of quantitative electrochemical analysis through a spectroellipsometric technique with a new function

被引:1
|
作者
Huang, ZQ [1 ]
Zhang, ST [1 ]
Chen, CG [1 ]
Xie, SF [1 ]
Yang, YR [1 ]
Zhu, W [1 ]
机构
[1] Chongqing Univ, Dept Appl Chem, Chongqing 630044, Peoples R China
关键词
optical tracking rate; spectroellipsometry; stripping ellipsometry;
D O I
10.1016/S0040-6090(97)90386-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ellipsometry with a new function the 'Optical tracking rate' (Vop), used to analyze electrochemical reactions as suggested by the authors, is described briefly. A series of applications of this new approach for qualitative and quantitative analysis including so-called potential scanning ellipsometry and stripping ellipsometry is introduced and discussed in this article. The experimental results indicate that stripping ellipsometry for quantitative analysis has a higher sensitivity and accuracy than the electrochemical method. (C) 1998 Published by Elsevier Science S.A.
引用
收藏
页码:781 / 784
页数:4
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