IGBT fault protection based on di/dt feedback control

被引:72
作者
Huang, Frank [1 ]
Flett, Fred [1 ]
机构
[1] Siemens VDO Elect Dr Inc, Dearborn, MI 48120 USA
来源
2007 IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6 | 2007年
关键词
D O I
10.1109/PESC.2007.4342213
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Customer power modules built with the latest IGBT chips may be operated to their extreme conditions in terms of junction temperature, switching speed and voltage and current ratings. This is of particular advantageous in electric/hybrid vehicle applications where power density is a critical design factor. With IGBTs operated at extreme conditions the fault response time with a traditional IGBT fault protection approach, such as Vce sensing approach, may not be fast enough. This paper presents a circuit configuration to identify an IGBT fault current by means of measuring the induced voltage across the stray inductance between the IGBT Kelvin emitter and power emitter. Upon fault current detection a feedback control is introduced to dynamically control the di/dt of the fault current. Once the fault current is contained at a predetermined level, a slow turn off mechanism is deployed. The effectiveness of the proposed IGBT protection scheme was validated with customer power modules using Infineon 3(rd) generation IGBT chips rated at 600V 1000A for 100kW electric drive systems used in fuel cell powered electric vehicles.
引用
收藏
页码:1478 / 1484
页数:7
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