Junction temperature measurement of light emitting diode by electroluminescence

被引：7
作者：
He, S. M. [1 ,2 ]
Luo, X. D. [1 ]
Zhang, B. [1 ]
Fu, L. [1 ]
Cheng, L. W. [1 ]
Wang, J. B. [2 ]
Lu, W. [1 ]
机构：
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Xiangtan Univ, Minist Educ, Key Lab Low Dimens Mat & Applicat Technol, Xiangtan 411105, Hunan, Peoples R China
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 12期
基金：
美国国家科学基金会;
关键词：
electroluminescence; LED lamps; temperature measurement; virtual instrumentation;
D O I：
10.1063/1.3664619
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Junction temperature (JT) is a key parameter of the performance and lifetime of light emitting diodes (LEDs). In this paper, a mobile instrument system has been developed for the non-contact measurement of JTs of LED under LabVIEW control. The electroluminescence (EL) peak shift of the LED is explored to measure the JT. Commercially available high power blue LEDs are measured. A linear relation between emission peak shift and JT is found. The accuracy of the JT is about 1 degrees C determined by the precision of the emission peak shift, +/- 0.03 nm, at 3 sigma standard deviation for blue LED. Using this system, on-line temperature rise curves of LED lamps are determined. (C) 2011 American Institute of Physics. [doi:10.1063/1.3664619]
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页数：4
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