The origin of anomalous peak and negative capacitance in the forward bias capacitance-voltage characteristics of Au/PVA/n-Si structures

被引:88
作者
Altindal, Semsettin [1 ]
Uslu, Habibe [1 ]
机构
[1] Gazi Univ, Fac Arts & Sci, Dept Phys, TR-06500 Ankara, Turkey
关键词
AU/POLYVINYL ALCOHOL (CO; ELECTRICAL CHARACTERISTICS; EXCESS CAPACITANCE; SERIES RESISTANCE; INTERFACE STATES; DIODES; INTIMATE;
D O I
10.1063/1.3554479
中图分类号
O59 [应用物理学];
学科分类号
摘要
The frequency dependence of capacitance-voltage (C-V) and conductance-voltage (G/omega-V) characteristics of the Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky barrier diodes (SBDs) was investigated in the frequency range of 3 kHz-3 MHz at room temperature by considering series resistance (R-s) and interface states (N-ss) effects. The C-V and G/omega-V characteristics confirm that the R-s and N-ss are important parameters that strongly influence the electrical parameters of SBDs. The C-V plots show an intersection point (similar to 2.9 V) at low frequencies (f <= 30 kHz) and then take negative values, which is known as negative capacitance (NC) behavior. The negativity of the C increases with the decreasing frequency in the forward bias voltage region, and this decrement in the NC corresponds to the increment in the conductance. Also, the forward bias C-V plots show an anomalous peak in the voltage range of 1.55-1.9 V depending on the frequency such that the anomalous peaks shift toward positive voltage values with the increasing frequency. The effect of R-s on the C is found appreciable at high frequencies. In addition, the values of N-ss and R-s are found to decrease with the increasing frequency. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3554479]
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页数:7
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共 45 条
  • [1] Temperature dependent negative capacitance behavior in (Ni/Au)/AlGaN/AlN/GaN heterostructures
    Arslan, Engin
    Safak, Yasemin
    Altindal, Semsettin
    Kelekci, Oezguer
    Ozbay, Ekmel
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2010, 356 (20-22) : 1006 - 1011
  • [2] Characterization of capacitance-frequency features of Sn/polypyrrole/n-Si structure as a function of temperature
    Aydogan, S
    Saglam, M
    Türüt, A
    [J]. POLYMER, 2005, 46 (16) : 6148 - 6153
  • [3] On the forward bias excess capacitance at intimate and MIS Schottky barrier diodes with perfect or imperfect ohmic back contact
    Bati, B
    Nuhoglu, Ç
    Saglam, M
    Ayyildiz, E
    Turüt, A
    [J]. PHYSICA SCRIPTA, 2000, 61 (02): : 209 - 212
  • [4] Negative capacitance caused by electron injection through interfacial states in organic light-emitting diodes
    Bisquert, J
    Garcia-Belmonte, G
    Pitarch, A
    Bolink, HJ
    [J]. CHEMICAL PHYSICS LETTERS, 2006, 422 (1-3) : 184 - 191
  • [5] Frequency dependent capacitance and conductance-voltage characteristics of Al/Si3N4/p-Si(100) MIS diodes
    Bulbul, M. M.
    Zeyrek, S.
    [J]. MICROELECTRONIC ENGINEERING, 2006, 83 (11-12) : 2522 - 2526
  • [6] ANOMALOUS INDUCTIVE EFFECT IN SELENIUM SCHOTTKY DIODES
    CHAMPNESS, CH
    CLARK, WR
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (12) : 1104 - 1106
  • [7] CHATTOPADHYAY P, 1992, SOLID STATE ELECTRON, V35, P875, DOI 10.1016/0038-1101(92)90290-S
  • [8] Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes
    Dokme, I.
    Altindal, S.
    Tunc, T.
    Uslu, I.
    [J]. MICROELECTRONICS RELIABILITY, 2010, 50 (01) : 39 - 44
  • [9] Negative capacitance in organic semiconductor devices: Bipolar injection and charge recombination mechanism
    Ehrenfreund, E.
    Lungenschmied, C.
    Dennler, G.
    Neugebauer, H.
    Sariciftci, N. S.
    [J]. APPLIED PHYSICS LETTERS, 2007, 91 (01)
  • [10] Sudden change of electrical characteristics at lasing threshold of a semiconductor laser
    Feng, L. F.
    Wang, C. D.
    Cong, H. X.
    Zhu, C. Y.
    Wang, Jun
    Xie, X. S.
    Lu, C. Z.
    Zhang, G. Y.
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2007, 43 (5-6) : 458 - 461