Electronic properties of Si(111)-7 x 7 and related reconstructions: Density functional theory calculations

被引:29
|
作者
Smeu, Manuel [1 ,2 ]
Guo, Hong [1 ,2 ]
Ji, Wei [3 ]
Wolkow, Robert A. [4 ]
机构
[1] McGill Univ, Ctr Phys Mat, Montreal, PQ H3A 2T8, Canada
[2] McGill Univ, Dept Phys, Montreal, PQ, Canada
[3] Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China
[4] Natl Res Council Canada, Natl Inst Nanotechnol, Edmonton, AB, Canada
来源
PHYSICAL REVIEW B | 2012年 / 85卷 / 19期
基金
中国国家自然科学基金; 加拿大自然科学与工程研究理事会; 北京市自然科学基金;
关键词
SCANNING-TUNNELING-MICROSCOPY; ATOMIC-FORCE MICROSCOPY; AUGMENTED-WAVE METHOD; CHARGE-TRANSFER; SURFACE; SPECTROSCOPY; DIFFRACTION; DIMERS;
D O I
10.1103/PhysRevB.85.195315
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The 7 x 7 reconstruction of Si(111) has the interesting property of being metallic despite bulk Si being a semiconductor. This surface has a complex reconstruction that takes on a dimer-adatom stacking fault (DAS) structure composed of adatoms, rest atoms, and several other key features. It is believed that the dangling bonds of the adatoms play a crucial role in the high conductivity and that this is predominantly a surface-state band effect. To elucidate the details of this mechanism, we investigate a set of related Si(111) reconstructions of increasing complexity in order to resolve the effect of the different DAS features on the electronic and transport properties of the Si(111)-7 x 7 surface. Density functional theory calculations are carried out on the root 3 x root 3-R30 degrees, 2 x 2, 5 x 5, and 7 x 7 reconstructions of Si(111). Since these surfaces are modeled as two-dimensional slabs, a careful investigation is carried out to determine the slab thickness needed to capture the structural and electronic properties of these systems. The densities of states (DOSs) projected on different atoms in these surfaces are then compared, revealing that the root 3 x root 3, 5 x 5, and 7 x 7 surfaces are metallic, while the 2 x 2 surface is semiconducting. Finally, the DOSs for Si(111)-7 x 7 are related to scanning tunneling microscope data to offer an explanation for different adatom prominence trends depending on Si sample doping.
引用
收藏
页数:9
相关论文
共 50 条
  • [31] PHOTOEMISSION FROM K/SI(111)7X7 AND CS/SI(111)7X7
    DITZINGER, UA
    LUNAU, C
    SCHIEWECK, B
    TOSCH, S
    NEDDERMEYER, H
    HANBUCKEN, M
    SURFACE SCIENCE, 1989, 211 (1-3) : 707 - 715
  • [32] Formation and electronic states of In nanoclusters on the Si(111)-7X7 surface
    Byun, Jung Hoon
    Shin, Jin Sung
    Kang, Pil Gyu
    Jeong, Hojin
    Yeom, Han Woong
    PHYSICAL REVIEW B, 2009, 79 (23)
  • [33] Roughening in Electronic Growth of Ag on Si(111)-(7x7) Surfaces
    Pal, Arindam
    Mahato, J. C.
    Dev, B. N.
    Goswami, D. K.
    ACS APPLIED MATERIALS & INTERFACES, 2013, 5 (19) : 9517 - 9521
  • [35] Surface morphology and electronic structure of Ge/Si(111) 7 x 7 system
    Lobo, A
    Gokhale, S
    Kulkarni, SK
    APPLIED SURFACE SCIENCE, 2001, 173 (3-4) : 270 - 281
  • [36] ATOMIC AND ELECTRONIC-STRUCTURE OF SI(111)7X7 SURFACE
    PANDEY, KC
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 399 - 399
  • [37] Local electronic structure of adatom vacancies on Si(111)-7 x 7 surface
    Yamauchi, T
    Takahara, Y
    Narita, N
    MATERIALS TRANSACTIONS, 2005, 46 (03) : 716 - 719
  • [38] ADATOM ELECTRONIC-STRUCTURE OF THE SI(111)7X7 SURFACE
    NICHOLLS, JM
    REIHL, B
    PHYSICAL REVIEW B, 1987, 36 (15): : 8071 - 8074
  • [39] Electronic structures of an extra Si atom diffusing in the Si(111)(7x7) surface
    Pan, BC
    SURFACE SCIENCE, 2005, 599 (1-3) : 85 - 92
  • [40] Experimental measurements of bond density at the Si(111)-7x7 surface
    Ciston, James
    Subramanian, Arun K.
    Robinson, Ian K.
    Marks, Laurence D.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C86 - C87