Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

被引：2

作者：

Sjoberg, Daniel ^{[1
]}

Larsson, Christer ^{[1
,2
]}

机构：

[1] Lund Univ, Elect & Informat Technol, Lund, Sweden

[2] Saab Dynam AB, Linkoping, Sweden

来源：

RADIO SCIENCE | 2015年 / 50卷 / 06期

关键词：

waveguide; material characterization; inverse scattering; COMPLEX PERMITTIVITY; DIELECTRIC MATERIALS; GENETIC ALGORITHMS; PERMEABILITY; BAND;

D O I：

10.1002/2014RS005551

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramer-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.

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收藏

页码：554 / 561

页数：8

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