Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

被引：2
作者：
Sjoberg, Daniel [1 ]
Larsson, Christer [1 ,2 ]
机构：
[1] Lund Univ, Elect & Informat Technol, Lund, Sweden
[2] Saab Dynam AB, Linkoping, Sweden
来源：
RADIO SCIENCE | 2015年 / 50卷 / 06期
关键词：
waveguide; material characterization; inverse scattering; COMPLEX PERMITTIVITY; DIELECTRIC MATERIALS; GENETIC ALGORITHMS; PERMEABILITY; BAND;
D O I：
10.1002/2014RS005551
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramer-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.
引用
收藏
页码：554 / 561
页数：8
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