Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

被引：17

作者：

Jones, Charles R. ^{[1
]}

Dutta, Jo ^{[1
]}

Yu, Guofen ^{[2
]}

Gao, Yuanci ^{[3
]}

机构：

[1] N Carolina Cent Univ, Dept Phys, Durham, NC 27707 USA

[2] Univ Findlay, Dept Phys, Findlay, OH 45840 USA

[3] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China

来源：

JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES | 2011年 / 32卷 / 06期

基金：

美国国家科学基金会;

关键词：

Dielectric properties; Loss tangent; millimeter-wave; Open resonator; Phase-locked backward-wave oscillators; SiC; PERMITTIVITY; RESONATORS; WINDOWS;

D O I：

10.1007/s10762-011-9795-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe here a system for accurate measurement of the dielectric properties of very low-loss materials in the 130 to 170 GHz frequency range. This system utilizes an open resonator with a quality factor similar to 1x10(6). Resonance curves for this resonator are acquired with a commercial spectrum analyzer equipped with an external millimeter-wave harmonic mixer. The excitation source is a backward-wave oscillator locked to the spectrum analyzer local oscillator via a digital phase-locked loop. This system permits rapid and accurate measurement of resonance curve line widths, permitting determination of loss tangents down to the 10(-6) range. Results are reported for silicon carbide (SiC), CVD diamond, sapphire, and quartz.

引用

页码：838 / 847

页数：10

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