Exploiting dynamic micro-architecture usage in gate sizing

被引:0
作者
Roy, Sanghamitra [1 ]
Chakraborty, Koushik [1 ]
机构
[1] Utah State Univ, Logan, UT 84322 USA
关键词
Gate sizing; Physical design automation; Micro-architecture;
D O I
10.1016/j.micpro.2011.03.002
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Modern high performance microprocessors incorporate an abundance of replicated structural components. Many of these components often experience substantially lower utilization while executing a diverse pool of applications. To recover energy efficiency from the lower utilization, system architects resort to dynamic voltage frequency scaling (DVFS). In this paper, we demonstrate that dynamic adaptations using DVFS are markedly energy inefficient than techniques that design circuits ground up for lower performance. We propose a novel microarchitecture aware gate sizing and threshold voltage assignment algorithm to mitigate this current limitation. Our technique is the first of its kind that exploits architectural slack in gate sizing, and leverages on-chip redundancy and slack. We evaluate this circuit-architectural co-optimization framework in a superscalar processor by combining standard cell based gate sizing flows with state-of-the-art architectural simulation. Our results show 17-46% improvement in the data-path energy efficiency over traditional circuit designs incorporating DVFS schemes. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:417 / 425
页数:9
相关论文
共 23 条
[1]  
[Anonymous], 2006, Tech. rep.
[2]  
Borkar S, 2009, DES AUT CON, P93
[3]  
Brooks D, 2000, PROCEEDING OF THE 27TH INTERNATIONAL SYMPOSIUM ON COMPUTER ARCHITECTURE, P83, DOI 10.1109/ISCA.2000.854380
[4]   Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation [J].
Chen, CP ;
Chu, CCN ;
Wong, DF .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1999, 18 (07) :1014-1025
[5]  
Chinnery D., 2003, SEM RES CORP TECHN C
[6]  
Chou H., 2005, P ASP DAC
[7]  
Davoodi A., 2006, P 43 P DAC
[8]  
Devi S., 2012, INT J ENG RES GEN SC, V4, P246, DOI [DOI 10.1145/1186736.1186737, 10.1145/1186736.1186737]
[9]  
Donald J, 2006, CONF PROC INT SYMP C, P78, DOI 10.1145/1150019.1136493
[10]  
Herbert S, 2007, ISLPED'07: PROCEEDINGS OF THE 2007 INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN, P38, DOI 10.1145/1283780.1283790