Effects of different needles and substrates on CuInS2 deposited by electrostatic spray deposition

被引：9
作者：
Roncallo, S. [1 ]
Painter, J. D. [1 ]
Healy, M. J. F. [1 ]
Ritchie, S. A. [2 ]
Finnis, M. V. [2 ]
Rogers, K. D. [3 ]
Scragg, J. J. [4 ]
Dale, P. J. [5 ]
Zoppi, G. [6 ]
机构：
[1] Cranfield Univ, Ctr Mat Sci & Engn, Swindon SN6 8LA, Wilts, England
[2] Cranfield Univ, Dept Engn Syst & Management, Swindon SN6 8LA, Wilts, England
[3] Cranfield Univ, Cranfield MK43 0AL, Beds, England
[4] Univ Bath, Bath BA2 7AY, Avon, England
[5] Univ Luxembourg, Lab Photovolta, L-4422 Belvaux, Luxembourg
[6] Northumbria Univ, Northumbria Photovolta Applicat Ctr, Newcastle Upon Tyne NE1 8ST, Tyne & Wear, England
来源：
THIN SOLID FILMS | 2011年 / 519卷 / 11期
基金：
英国工程与自然科学研究理事会;
关键词：
CuInS2; Electrostatic spray deposition (ESD); Coating uniformity; Solar cells; Deposition conditions; Needles; Substrates; THIN-FILMS; SOLAR-CELLS; PROCESS PARAMETERS; ELECTRODEPOSITION; EVAPORATION; UNIFORMITY; OXIDE;
D O I：
10.1016/j.tsf.2011.01.248
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Copper indium disulphide (CuInS2) thin films were deposited using the electrostatic spray deposition method. The effects of applied voltage and solution flow rate on the aerosol cone shape, film composition, surface morphology and current conversion were investigated. The effect of aluminium substrates and transparent fluorine doped tin oxide (SnO2:F) coated glass substrates on the properties of as-deposited CuInS2 films were analysed. An oxidation process occurs during the deposition onto the metallic substrates which forms an insulating layer between the photoactive film and substrate. The effects of two different spray needles on the properties of the as-deposited films were also studied. The results reveal that the use of a stainless steel needle results in contamination of the film due to the transfer of metal impurities through the spray whilst this is not seen for the glass needle. The films were characterised using a number of different analytical techniques such as X-ray diffraction, scanning electron microscopy, Rutherford back-scattering and secondary ion mass spectroscopy and opto-electronic measurements. (C) 2011 Elsevier B.V. All rights reserved,
引用
收藏
页码：3544 / 3551
页数：8
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