Total-reflection high-energy positron diffraction (TRHEPD) for structure determination of the topmost and immediate sub-surface atomic layers

被引：19

作者：

Fukaya, Yuki ^{[1
]}

Kawasuso, Atsuo ^{[2
]}

Ichimiya, Ayahiko ^{[3
,4
]}

Hyodo, Toshio ^{[4
]}

机构：

[1] Japan Atom Energy Agcy, Adv Sci Res Ctr, 2-4 Shirakata, Naka, Ibaraki 3191195, Japan

[2] Natl Inst Quantum & Radiol Sci & Technol, 1233 Watanuki, Takasaki, Gunma 3701292, Japan

[3] Nagoya Univ, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648601, Japan

[4] High Energy Accelerator Res Org KEK, Inst Mat Struct Sci, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2019年 / 52卷 / 01期

关键词：

positron; diffraction; surface; structure; total-reflection; SURFACE SCIENCE; X-RAY; ELECTRONIC-PROPERTIES; GERMANENE; GRAPHENE; TRANSMISSION; BEAM; RECONSTRUCTION; SI(111)7X7; AG;

D O I：

10.1088/1361-6463/aadf14

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Total-reflection high-energy positron diffraction (TRHEPD) has recently been developed to investigate the surface structure (atomic geometry) and surface properties of materials. It is the positron (the antiparticle of the electron) counterpart of reflection high-energy electron diffraction (RHEED). Depending on the glancing angle of incidence, positrons are totally reflected from the surface or shallowly penetrate into the bulk of the sample solid. Thus, it is possible to obtain information about the topmost and immediate sub-surface layers without the background effect of the bulk. In this review, this distinctive feature of the TRHEPD process and some of the results on surface structures and characteristics are described.

引用

页数：19

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