A review of basic crystallography and x-ray diffraction applications

被引:79
作者
Ameh, E. S. [1 ]
机构
[1] Univ Benin, Dept Mech Engn, Benin, Edo State, Nigeria
关键词
Crystal structure; Crystallography; Intensity; Lattice; Unit cell; X-ray diffraction; THERMAL-EXPANSION; ORIENTATION; TEMPERATURE; ANATASE;
D O I
10.1007/s00170-019-04508-1
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Although various researched works have been carried out in x-ray crystallography and its applications, but there are still limited number of researches on crystallographic theories and industrial application of x-ray diffraction. The present study reviewed and provided detailed discussion on atomic arrangement of single crystals, mathematical concept of Bravais, reciprocal lattice, and application of x-ray diffraction. Determination of phase identification, crystal structure, dislocation density, crystallographic orientation, and gran size using x-ray diffraction peak intensity, peak position, and peak width were discussed. The detailed review of crystallographic theories and x-ray diffraction application would benefit majorly engineers and specialists in chemical, mining, iron, and steel industries.
引用
收藏
页码:3289 / 3302
页数:14
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