Noise-Aware DVFS Transition Sequence Optimization for Battery-Powered IoT Devices

被引:4
|
作者
Luo, Shaoheng [1 ]
Zhuo, Cheng [1 ]
Gan, Houle [2 ]
机构
[1] Zhejiang Univ, Coll Microelect, Hangzhou 310027, Zhejiang, Peoples R China
[2] Google Inc, Mountain View, CA 94043 USA
来源
2018 55TH ACM/ESDA/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | 2018年
关键词
GRID ANALYSIS; NETWORK; VOLTAGE;
D O I
10.1145/3195970.3196080
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Low power system-on-chips (SoCs) are now at the heart of Internet-of-Things (IoT) devices, which are well known for their bursty workloads and limited energy storage - usually in the form of tiny batteries. To ensure battery lifetime, DVFS has become an essential technique in such SoC chips. With continuously decreasing supply level, noise margins in these devices are already being squeezed. During DVFS transition, large current that accompanies the clock speed transition runs into or out of clock networks in a few clock cycles, and induces large Ldi / dt noise, thereby stressing the power delivery network (PDN). Due to the limited area and cost target, adding additional decap to mitigate such noise is usually challenging. A common approach is to gradually introduce/remove the additional clock cycles to increase or reduce the clock frequency in steps, a.k.a., clock skipping. However, such a technique may increase DVFS transition time, and still cannot guarantee minimal noise. In this work, we propose a new noise-aware DVFS sequence optimization technique by formulating a mixed 0/1 programming to resolve the problems of clock skipping sequence optimization. Moreover, the method is also extended to schedule extensive wake-up activities on different clock domains for the same purpose. The results show that we are able to achieve minimal-noise sequence within desired transition time with 53% noise reduction and save more than 15-17% power compared with the traditional approach.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Noise-Aware DVFS for Efficient Transitions on Battery-Powered IoT Devices
    Zhuo, Cheng
    Luo, Shaoheng
    Gan, Houle
    Hu, Jiang
    Shi, Zhiguo
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 39 (07) : 1498 - 1510
  • [2] Energy-Reliability Aware Link Optimization for Battery-Powered IoT Devices With Nonideal Power Amplifiers
    Mahmood, Aamir
    Hossain, M. M. Aftab
    Cavdar, Cicek
    Gidlund, Mikael
    IEEE INTERNET OF THINGS JOURNAL, 2019, 6 (03): : 5058 - 5067
  • [3] Towards realistic lifetime estimation in battery-powered IoT devices
    Feeney, Laura Marie
    Hartung, Robert
    Rohner, Christian
    Kulau, Ulf
    Wolf, Lars
    Gunningberg, Per
    PROCEEDINGS OF THE 15TH ACM CONFERENCE ON EMBEDDED NETWORKED SENSOR SYSTEMS (SENSYS'17), 2017,
  • [4] Battery-Powered Devices in WPCNs
    Biason, Alessandro
    Zorzi, Michele
    IEEE TRANSACTIONS ON COMMUNICATIONS, 2017, 65 (01) : 216 - 229
  • [5] Power-aware gateway connectivity in battery-powered dynamic IoT networks
    Karthikeya, Surabhi Abhimithra
    Narayanan, Revathy
    Murthy, Siva Ram C.
    COMPUTER NETWORKS, 2018, 130 : 81 - 93
  • [6] Computing Lifetimes for Battery-Powered Devices
    Jongerden, Marijn
    Haverkort, Boudewijn
    OPERATIONS RESEARCH PROCEEDINGS 2010, 2011, : 193 - 198
  • [7] Long-term Throughput Optimization in WPCN with Battery-Powered Devices
    Biason, Alessandro
    Zorzi, Michele
    2016 IEEE WIRELESS COMMUNICATIONS AND NETWORKING CONFERENCE, 2016,
  • [8] Modelling of the Energy Depletion Process and Battery Depletion Attacks for Battery-Powered Internet of Things (IoT) Devices
    Kuaban, Godlove Suila
    Gelenbe, Erol
    Czachorski, Tadeusz
    Czekalski, Piotr
    Tangka, Julius Kewir
    SENSORS, 2023, 23 (13)
  • [9] A 0.5V/1.0V Fast Lock-In ADPLL for DVFS Battery-Powered Devices
    Chung, Ching-Che
    Sheng, Duo
    Su, Wei-Siang
    2013 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION, AND TEST (VLSI-DAT), 2013,
  • [10] A 0.5V/1.0V Fast Lock-In ADPLL for DVFS Battery-Powered Devices
    Chung, Ching-Che
    Sheng, Duo
    Su, Wei-Siang
    2013 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION, AND TEST (VLSI-DAT), 2013,