Space-charge dominated epitaxial BaTiO3 heterostructures

被引:84
作者
Zhang, Wei [1 ,3 ,4 ]
Gao, Yiqun [1 ]
Kang, Limin [1 ]
Yuan, Meiling [1 ]
Yang, Qian [1 ]
Cheng, Hongbo [1 ]
Pan, Wei [2 ]
Ouyang, Jun [1 ]
机构
[1] Shandong Univ, Key Lab Liquid Solid Struct Evolut & Proc Mat, Engn Ceram Key Lab Shandong Prov, Minist Educ,Sch Mat Sci & Engn, Jinan 250061, Shandong, Peoples R China
[2] Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
[3] Nanjing Univ Posts & Telecommun, Sch Optoelect Engn, Nanjing 210023, Jiangsu, Peoples R China
[4] Nanjing Univ Posts & Telecommun, Peter Grunberg Res Ctr, Nanjing 210023, Jiangsu, Peoples R China
关键词
Transport mechanism; Leakage current; Schottky contacts; Barium titanate; Epitaxial films; FERROELECTRIC THIN-FILMS; POLYCRYSTALLINE; CONDUCTION; TRANSPORT;
D O I
10.1016/j.actamat.2014.10.063
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial BaTiO3 thin films (similar to 300 nm thick) with various conductive oxide bottom electrodes including (La0.5Sr0.5)CoO3, SrRuO3 and LaNiO3 were prepared on single-crystalline SrTiO3 substrates using a radiofrequency magnetron sputtering technique in an oxygen-rich atmosphere and at a deposition temperature of 700 degrees C. The charge transport phenomena of these films were systematically investigated. Comparison of leakage current levels with respect to different BaTiO3 bottom electrode interfaces gave a direct proof of the p-type semiconducting behavior in the BaTiO3 films, whose I-V characteristics were well described by a modified Schottky contact model up to an applied field of similar to 60 MV m(-1). By adapting this model, we obtained interface potential barriers, space-charge and free charge carrier densities, as well as depletion layer width and interface layer thickness for the epitaxial BaTiO3 films. The dominance of space-charges (similar to 10(20) cm(-3)) over intrinsic polarizations in these films well explained the apparent reduction in remnant polarization and tilting of the P V hysteresis loops, as well as an enhanced dielectric strength. Further increase of the applied electric field will result in complete depletion of the BTO films. Consequently, charge transport in these films will become bulk-controlled. This prediction was validated by experimental J-V curves acquired for a broad range of applied electric field, where ionic conduction and Pool-Frenkel emission currents consecutively dominated in the high field (60-220 MV m(-1)) and ultrahigh field (220-300 MV m(-1)) regions. Finally, the potential of these lead-free heterostructures as high-energy density dielectric capacitors was demonstrated. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:207 / 215
页数:9
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