Integration of InP/InGaAsP photodetectors onto silicon-on-insulator waveguide circuits

被引:67
作者
Roelkens, G
Brouckaert, J
Taillaert, D
Dumon, P
Bogaerts, W
Van Thourhout, D
Baets, R
Nötzel, R
Smit, M
机构
[1] Univ Ghent, IMEC, Dept Informat Technol, B-9000 Ghent, Belgium
[2] Tech Univ Eindhoven, OED Grp, NL-5600 MB Eindhoven, Netherlands
来源
OPTICS EXPRESS | 2005年 / 13卷 / 25期
关键词
D O I
10.1364/OPEX.13.010102
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The integration of optical functionalities on a chip has been a long standing goal in the optical community. Given the call for more integration, Silicon-on-Insulator (SOI) is a material system of great interest. Although mature CMOS technology can be used for the fabrication of passive optical functionality, particular photonic functions like efficient light emission still require III-V semiconductors. We present the technology for heterogeneous integration of III-V semiconductor optical components and SOI passive optical components using benzocyclobutene (BCB) die to wafer bonding. InP/InGaAsP photodetectors on SOI waveguide circuits were fabricated. The developed process is compatible with the fabrication of InP/InGaAsP light emitters on SOI. (c) 2005 Optical Society of America.
引用
收藏
页码:10102 / 10108
页数:7
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