Impact of feature extraction to accuracy of machine learning based hot spot detection

被引:2
作者
Mitsuhashi, Takashi [1 ]
机构
[1] Aktina Solut LLC, 10-3 Kugenuma Hanazawa Cho, Fujisawa, Kanagawa 2510023, Japan
来源
PHOTOMASK TECHNOLOGY 2017 | 2017年 / 10451卷
关键词
Lithography; Hotspot Detection; Feature Extraction; Comparison; Machine Learning; Support Vector Machine; SVM;
D O I
10.1117/12.2282414
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Machine learning based hot spot detection is an emerging area in verification of mask and layout design. In machine learning, feature extraction methods suitable for application domains are as important as learning and inference algorithm itself for detection accuracy. In this paper, several feature extraction methods were proposed and implemented, and compared using a standard bench mark dataset. Preferable characteristics for the good feature extraction will be discussed. Comparison studies indicated that combination of a good feature extraction method and a standard machine learning algorithm often gave excellent results compared with previously reported results.
引用
收藏
页数:10
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