Plasmonic Structures, Materials and Lenses for Optical Lithography beyond the Diffraction Limit: A Review

被引:53
作者
Wang, Changtao [1 ]
Zhang, Wei [1 ]
Zhao, Zeyu [1 ]
Wang, Yanqin [1 ]
Gao, Ping [1 ]
Luo, Yunfei [1 ]
Luo, Xiangang [1 ]
机构
[1] Chinese Acad Sci, Inst Opt & Elect, State Key Lab Opt Technol Nanofabricat & Microeng, Chengdu 610209, Peoples R China
关键词
surface plasmon polaritons; bulk plasmon polaritons; diffraction limit; subwavelength optics; near-field optics; metamaterial; super resolution; nano optical lithography; nanostructure fabrication; CIRCULAR-POLARIZATION ANALYZER; OFF-AXIS ILLUMINATION; HIGH-ASPECT-RATIO; NEAR-FIELD; NEGATIVE REFRACTION; INTERFERENCE LITHOGRAPHY; SUPERLENS LITHOGRAPHY; SURFACE-PLASMONS; SCANNING PROBE; PHOTOLITHOGRAPHY;
D O I
10.3390/mi7070118
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The rapid development of nanotechnologies and sciences has led to the great demand for novel lithography methods allowing large area, low cost and high resolution nano fabrications. Characterized by unique sub-diffraction optical features like propagation with an ultra-short wavelength and great field enhancement in subwavelength regions, surface plasmon polaritons (SPPs), including surface plasmon waves, bulk plasmon polaritons (BPPs) and localized surface plasmons (LSPs), have become potentially promising candidates for nano lithography. In this paper, investigations into plasmonic lithography in the manner of point-to-point writing, interference and imaging were reviewed in detail. Theoretical simulations and experiments have demonstrated plasmonic lithography resolution far beyond the conventional diffraction limit, even with ultraviolet light sources and single exposure performances. Half-pitch resolution as high as 22 nm (similar to 1/17 light wavelength) was observed in plasmonic lens imaging lithography. Moreover, not only the overview of state-of-the-art results, but also the physics behind them and future research suggestions are discussed as well.
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页数:33
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