Dynamic characterization of built-in current sensors based on PN junctions: Analysis and experiments

被引：2

作者：

Rius, J

Figueras, J

机构：

[1] Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, 08028 Barcelona

[2] Electronics Dept., Universitat Politècnica de Catalunya, Barcelona

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1996年 / 9卷 / 03期

关键词：

current testing; I-DDQ testability; Built-In Current Sensors;

D O I：

10.1007/BF00134693

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The goal of this work is to analyze the performance of PN junction-based Built-In Current Sensors (BICS) for I-DDQ testing. Two types of BIC Sensors are analyzed: one based on a simple PN junction as the sensing element (DBICS), and the other based on a lateral BJT (PBICS). The sensitivity, speed and performance of the BICS are studied by showing their dependence on circuit parameters. Design constraints of such sensors in order to achieve performance criteria on CUT and BICS are analyzed. The dynamic analysis of the BICS is compared with experimental results when the PN junction BICS are used on a CMOS circuit.

引用

页码：295 / 310

页数：16

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