X-rays and electrical characterizations of ordered mesostructurated silica thin films used as sensing membranes

被引：9

作者：

Bertolo, JM ^{[1
]}

Bearzotti, A ^{[1
]}

Generosi, A ^{[1
]}

Palummo, L ^{[1
]}

Albertini, VR ^{[1
]}

机构：

[1] Univ Roma Tor Vergata, IMM, CNR, Sez Roma, I-00133 Rome, Italy

来源：

SENSORS AND ACTUATORS B-CHEMICAL | 2005年 / 111卷

关键词：

mesoporosity; chemical sensor; energy dispersion X-ray analysis; humidity; REFLECTOMETRY;

D O I：

10.1016/j.snb.2005.07.001

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Mesoporous silica (MPS) thin films were characterized by X-ray analysis and electrical measurements to investigate possible correlation between structural order and best response of this kind of sensing material toward RH and alcohols vapours. Both energy dispersive Xray diffraction and X-ray reflectometry results have been discussed to describe the ordered porosity distribution in the amorphous film. A phenomenological trend of the resistive-type sensors response changing calcination has been found and related to the change in the porosity order of MPS thin film. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：145 / 149

页数：5

共 18 条

[1] General predictive syntheses of cubic, hexagonal, and lamellar silica and titania mesostructured thin films [J].

Alberius, PCA ;

Frindell, KL ;

Hayward, RC ;

Kramer, EJ ;

Stucky, GD ;

Chmelka, BF .

CHEMISTRY OF MATERIALS, 2002, 14 (08) :3284-3294

[2] Time-resolved energy dispersive x-ray reflectometry measurements on ruthenium phthalocyanine gas sensing films [J].

Albertini, VR ;

Generosi, A ;

Paci, B ;

Perfetti, P ;

Rossi, G ;

Capobianchi, A ;

Paoletti, AM ;

Caminiti, R .

APPLIED PHYSICS LETTERS, 2003, 82 (22) :3868-3870

[3]

Bertolo JM, 2003, SENSOR LETT, V1, P64, DOI 10.1106/s1.2003.006

[4]

Brinker CJ, 1999, ADV MATER, V11, P579, DOI 10.1002/(SICI)1521-4095(199905)11:7<579::AID-ADMA579>3.3.CO

[5]

2-I

[6] The kinetics of phase transitions observed by energy-dispersive X-ray diffraction [J].

Caminiti, R ;

Albertini, VR .

INTERNATIONAL REVIEWS IN PHYSICAL CHEMISTRY, 1999, 18 (02) :263-299

[7]

CAMINITI R, 1993, Patent No. 01261484

[8] A Contribution on Some Basic Definitions of Sensors Properties [J].

D'Amico, Arnaldo ;

Di Natale, Corrado .

IEEE SENSORS JOURNAL, 2001, 1 (03) :183-190

[9] Energy dispersive X-ray reflectometry of the NO2 interaction with ruthenium phthalocyanine films [J].

Generosi, A ;

Albertini, VR ;

Rossi, G ;

Pennesi, G ;

Caminiti, R .

JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (02) :575-579

[10]

Hozumi A, 2000, ADV MATER, V12, P985, DOI 10.1002/1521-4095(200006)12:13<985::AID-ADMA985>3.0.CO

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