Vibration Errors in Phase-shifting Interferometer with Absolute Testing

被引:0
作者
Jia Xin [1 ]
Xing Tingwen [1 ]
机构
[1] Chinese Acad Sci, Inst Opt & Elect, Lab Appl Opt, Chengdu 610209, Peoples R China
来源
SEVENTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION | 2011年 / 8321卷
关键词
Optical Testing; Interference testing; Surface Testing; Absolute Testing; Vibration;
D O I
10.1117/12.905089
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Requirements for the measurement resolution in the sub-nanometer range have become quite common. Result of the testing contain the reference surface errors and test surface errors in the high-accuracy Phase shifting interferometer (PSI) which test the relative phase between the two surface. The test accuracy can be achieved by removing the error of reference surface. In this case, one of body of so-called absolute tests must be used which can test the systematic errors, including the reference surface, of the instrument to be used to improve the test accuracy. Unexpected mechanical vibrations can significantly degrade the otherwise high accuracy of phase-shifting interferometer. The data acquisition is sensitivity to vibration with a function of the frequency. The influence of the longitudinal vibration is analyzed in this paper. We use Zernike polynomials to generate 3 plats. Then the Matlab is used to simulate the 4 frames phase-shift algorithms and absolute testing algorithms. An experiment used the Zygo interferometer to prove the arithmetic and we can see the vibration errors in the testing.
引用
收藏
页数:8
相关论文
共 11 条
  • [1] Ai C., 1992, OPTICAL FABRICATION, V24
  • [2] ABSOLUTE TESTING OF FLATS BY USING EVEN AND ODD FUNCTIONS
    AI, CY
    WYANT, JC
    [J]. APPLIED OPTICS, 1993, 32 (25): : 4698 - 4705
  • [3] AI CY, 1992, P SOC PHOTO-OPT INS, V1776, P73
  • [4] VIBRATION IN PHASE-SHIFTING INTERFEROMETRY
    DEGROOT, PJ
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (02) : 354 - 365
  • [5] ESTABLISHING A FLATNESS STANDARD
    ELSSNER, KE
    VOGEL, A
    GRZANNA, J
    SCHULZ, G
    [J]. APPLIED OPTICS, 1994, 33 (13) : 2437 - 2446
  • [6] Evans Chris J., 1996, APPL OPT, V35
  • [7] FREISCHLAD K, 2001, Patent No. 6184994
  • [8] Freischlad Klaus R., 2001, APPL OPT, V40
  • [9] Malacara Danial., 2006, Optical Shop Testing: Third Edition, P1, DOI [DOI 10.1002/9780470135976, 10.1002/9780470135976]
  • [10] PRECISE MEASUREMENT OF PLANENESS
    SCHULZ, G
    SCHWIDER, J
    [J]. APPLIED OPTICS, 1967, 6 (06): : 1077 - &