Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS

被引：22

作者：

Hijazi, H. ^{[1
]}

Rothard, H. ^{[1
]}

Boduch, P. ^{[1
]}

Alzaher, I. ^{[1
]}

Ropars, F. ^{[1
]}

Cassimi, A. ^{[1
]}

Ramillon, J. M. ^{[1
]}

Been, T. ^{[1
]}

d'Etat, B. Ban ^{[1
]}

Lebius, H. ^{[1
]}

Farenzena, L. S. ^{[2
]}

da Silveira, E. F. ^{[3
]}

机构：

[1] Univ Caen Basse Normandie, CIMAP CIRIL Ganil, Ctr Rech Ions Mat & Photon CIMAP, ENSICAEN,CEA CNRS UMR 6252, F-14070 Caen 05, France

[2] Univ Fed Santa Catarina, Dept Phys, Florianopolis, SC, Brazil

[3] Pontificia Univ Catolica PUC, Dept Fis, BR-22453900 Rio De Janeiro, Brazil

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2011年 / 269卷 / 09期

关键词：

Sputtering; Highly charged ions; Lithium fluoride; HIGHLY-CHARGED IONS; EMISSION; IMPACT; ENERGY;

D O I：

10.1016/j.nimb.2010.12.062

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Sputtering occurs as a result of deposition of kinetic or potential energy in solids irradiated with swift particles. We studied ejection of secondary ions from LiF induced by swift heavy ion impact. A new UHV system allows measuring the mass distributions and the velocity vectors of each emitted secondary ion by means of time-of-flight and imaging techniques (XY-TOF-SIMS) with controlled target surfaces. We present results performed at GANIL (Caen) with Ca beams at 7.6 and 9 MeV/u (electronic stopping regime). Under UHV conditions, particles emitted from cleaved LiF monocrystals include the omnipresent hydrogen, and the two isotopes of natural LiF (Li-6(+) and Li-7(+)). Two groups of clusters, namely Li-n(+) and (LiF)(n)Li+ appear. The cluster size (n) dependence of the cluster ion yields Y(n) can be described by an exponential function. LiF emission as ionic clusters (LiF)(n)Li+ with n >= 2 is dominant over emission as monomers LiFLi+. (c) 2011 Elsevier B.V. All rights reserved.

引用

页码：1003 / 1006

页数：4

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