Structural, optical, and luminescence properties of ZnO:Ga optical scintillation ceramic

被引:16
作者
Gorokhova, E., I [1 ]
Eron'ko, S. B. [1 ]
Oreshchenko, E. A. [1 ]
Sandulenko, A., V [1 ]
Rodnyi, P. A. [2 ]
Chernenko, K. A. [2 ,3 ]
Venevtsev, I. D. [2 ]
Kul'kov, A. M. [4 ]
Muktepavela, Faina [5 ]
Boutachkov, Plamen [6 ]
机构
[1] SI Vavilov State Opt Inst Sci Prod Enterprise, St Petersburg, Russia
[2] Peter Great St Petersburg Polytech Univ, St Petersburg, Russia
[3] Lund Univ, MAX IV Lab, POB 118, SE-22100 Lund, Sweden
[4] St Petersburg State Univ, St Petersburg, Russia
[5] Univ Latvia, Inst Solid State Phys, Riga, Latvia
[6] GSI Helmholtzzentrum Schwerionenforsch GmbH, Darmstadt, Germany
基金
俄罗斯基础研究基金会;
关键词
GA; MORPHOLOGY; CRYSTALS; GROWTH; FILMS;
D O I
10.1364/JOT.85.000729
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper discusses the characteristics of ZnO and ZnO:Ga ceramics fabricated by uniaxial hot pressing. The short-wavelength transmission limit of zinc oxide ceramics is in the 370-nm region; the long-wavelength limit is determined by the free-charge-carrier concentration and lies in the interval from 5 to 9 mu m. The total transmittance of such ceramics in the visible and near-IR regions is about 70% when the sample is 0.5 mm thick. The luminescence spectrum is represented by a broad emission band with maximum at 580 nm, having a defect nature. The introduction of 0.03-0.1 mass % gallium into the zinc oxide structure inhibits grain growth and increases the free-charge-carrier concentration to 3.44 x 10(19) cm(-3). As the gallium concentration increases in the range 0.05-0.1 mass % in a ceramic of composition ZnO:Ga, the defect luminescence band is suppressed and a characteristic exciton luminescence is formed with a maximum corresponding to 389 nm and a damping time constant of 1.1 ns. (C) 2018 Optical Society of America
引用
收藏
页码:729 / 737
页数:9
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