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Investigation of frequency effect on electrical fatigue and crack tip domain-switching behaviors in Pb(Mg1/3Nb2/3))0.65Ti0.35O3 ceramics via synchrotron X-ray diffraction
被引:9
|作者:
Promsawat, Methee
[1
]
Promsawat, Napatporn
[2
]
Jiansirisomboon, Sukanda
[3
]
Namsar, Orapim
[3
]
Marlton, Fred
[4
]
Daniels, John
[4
]
Pojprapai, Soodkhet
[3
]
机构:
[1] Prince Songkla Univ, Fac Sci, Dept Mat Sci & Technol, 15 Kanjanavanich Rd, Hat Yai 90112, Songkhla, Thailand
[2] Synchrotron Light Res Inst, 111 Univ Ave, Muang 30000, Nakhon Ratchasi, Thailand
[3] Suranaree Univ Technol, Sch Ceram Engn, 111 Univ Ave, Muang 30000, Nakhon Ratchasi, Thailand
[4] Univ New South Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
基金:
澳大利亚研究理事会;
关键词:
Electrical fatigue;
PMNT;
High-energy x-ray diffraction;
Domain switching;
Frequency effect;
LEAD-ZIRCONATE-TITANATE;
GROWTH;
FERROELECTRICS;
TEMPERATURE;
ACTUATORS;
MECHANISM;
D O I:
10.1016/j.jeurceramsoc.2017.06.020
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
The effect of frequency on the electrical fatigue, crack growth and domain switching in Pb(Mg1/3Nb2/3)(0.65)Ti0.35O3 ceramics has been investigated. The changes in microstructure, ferroelectric properties and domain-switching behavior of samples fatigued at 1, 10, 50 and 100 Hz were determined. In this experiment, we found that the thickness of the damaged layer under the electrodes and the crack length decrease with increasing frequency. The remnant polarization decreases while the coercive field increases with an increasing number of loading cycles. A domain orientation map around the crack tip was revealed using scanning high-energy X-ray diffraction from a synchrotron source. This showed the effect of fatigue frequency on the lattice strain distribution and ferroelectric domain texture around the crack tip. (C) 2017 Elsevier Ltd. All rights reserved.
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页码:4609 / 4616
页数:8
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