A 2.5-V 2.0-Gbyte/s 288-Mb packet-based DRAM with enhanced cell efficiency and noise immunity

被引:3
|
作者
Kyung, KH [1 ]
Lee, HC [1 ]
Song, KW [1 ]
Song, HS [1 ]
Jung, K [1 ]
Moon, JS [1 ]
Kim, BS [1 ]
Cho, SB [1 ]
Kim, C [1 ]
Cho, SI [1 ]
机构
[1] Samsung Elect Co Ltd, Memory Prod & Technol Div, DRAM Team 3, Kyungki Do, South Korea
关键词
bitline equalizing scheme; channel skew; chip architecture; CMOS DRAM; column redundancy; current control; package parasitics; sense amplifier;
D O I
10.1109/4.918910
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 2.5-V 288-Mb packet-based DRAM with 32 banks and 18-DQ organization architecture achieving a peak bandwidth of 2.0-GB/s at V-DD = 2.25 V and T = 100 degreesC has been developed using 1) an area- and performance-efficient chip architecture with a mixture of high-speed interface circuits with DRAM peripheral circuits to increase cell efficiency; 2) a multilevel controlled bitline equalizing scheme and a distributed sense amplifier driving scheme to enhance DRAM core timing margin while increasing the number of cells per wordline for cell efficiency over the previous subwordline driving scheme; 3) a flexible column redundancy scheme with multiple fuse boxes instead of excessive spare memory cell arrays for 144 internal I/O architecture; and 4) optimized I/O circuits and pin parasitic design including pad and package to maximize the operating frequency.
引用
收藏
页码:735 / 743
页数:9
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