Early metrics for object oriented information systems

被引:0
作者
Genero, M [1 ]
Manso, ME [1 ]
Piattini, M [1 ]
García, F [1 ]
机构
[1] Univ Castilla La Mancha, Dept Comp Sci, E-13071 Ciudad Real, Spain
来源
OOIS 2000: 6TH INTERNATIONAL CONFERENCE ON OBJECT ORIENTED INFORMATION SYSTEMS, PROCEEDINGS | 2001年
关键词
qualify in object oriented information systems; object oriented metrics; class diagrams complexity; UML class diagrams;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The quality of object oriented information systems (OOIS) depends greatly on the decisions taken at the initial phases of their development. In a typical object oriented information systems development a class diagram is first built. Class diagrams lay the foundation for all later design work So, their quality heavily affects on the product that will be ultimately implemented Even though the appearance of the Unified Modelling Language (UML) as a standard of modelling OOIS have provided a great contribution towards building quality OOIS, it is not enough. Early availability of metrics is a key factor in the successful management of OOIS development. The goal of this work is to propose a set of metrics in order to assess the complexity of UML class diagrams. We also put the proposed metrics under empirical validation in order to provide empirical support to their practical significance and usefulness.
引用
收藏
页码:414 / 425
页数:12
相关论文
共 27 条
[1]  
Abreu FBE, 1999, LECT NOTES COMPUT SC, V1743, P326
[2]  
ABREU FBE, 1996, P 3 INT METR S
[3]   Building knowledge through families of experiments [J].
Basili, VR ;
Lanubile, F .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1999, 25 (04) :456-473
[4]  
BRIAND L, 1999, 03799E IESE FRAUNH I
[5]   Defining and validating measures for object-based high-level design [J].
Briand, LC ;
Morasca, S ;
Basili, VR .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1999, 25 (05) :722-743
[6]  
BRITO F, 1996, P 3 INT METR S
[7]   A METRICS SUITE FOR OBJECT-ORIENTED DESIGN [J].
CHIDAMBER, SR ;
KEMERER, CF .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1994, 20 (06) :476-493
[8]  
DERR K, 1995, APPL OMT
[9]   SOFTWARE MEASUREMENT - A NECESSARY SCIENTIFIC BASIS [J].
FENTON, N .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1994, 20 (03) :199-206
[10]  
Fenton N., 1997, SOFTWARE METRICS RIG