X-ray diffraction anomalies and random intercalation in H-loaded Y-Ba-Cu-O films

被引:5
|
作者
Ariosa, D [1 ]
Tsaneva, VN
Barber, ZH
机构
[1] EPFL, FSB, IPMC, Lausanne, Switzerland
[2] Univ Cambridge, Dept Mat Sci, Cambridge, England
关键词
disorder; high-temperature superconductors; thin films; x-ray measurements;
D O I
10.1109/TASC.2005.848698
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A model has been developed to account for the structural peculiarities observed by X-ray diffraction of hydrogen-loaded Y123 films deposited in an O-2/Ar + H2O atmosphere. The model considers the random inter-growth of two very similar structures with slightly different c-axis or, equivalently, the random intercalation of a small spacer in the Y123 matrix causing displacement disorder along the c-axis direction. It quantitatively reproduces both the nonmonotonous deviations of Bragg-peaks and their progressive weakening and broadening for higher diffraction orders. The model offers the possibility to evaluate both the fraction of secondary phase and its c-axis lattice parameter. In the example given, we have been able to identify 28% of intercalated hydrogen bronze H-0.66[Y123] with 4% elongated c-axis. A simplified procedure for the diagnosis and characterization of random intercalates is extracted from the model. Similar structures observed in other perovskite-based layered oxides are discussed within this framework.
引用
收藏
页码:2993 / 2996
页数:4
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