X-ray diffraction anomalies and random intercalation in H-loaded Y-Ba-Cu-O films

被引:5
|
作者
Ariosa, D [1 ]
Tsaneva, VN
Barber, ZH
机构
[1] EPFL, FSB, IPMC, Lausanne, Switzerland
[2] Univ Cambridge, Dept Mat Sci, Cambridge, England
关键词
disorder; high-temperature superconductors; thin films; x-ray measurements;
D O I
10.1109/TASC.2005.848698
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A model has been developed to account for the structural peculiarities observed by X-ray diffraction of hydrogen-loaded Y123 films deposited in an O-2/Ar + H2O atmosphere. The model considers the random inter-growth of two very similar structures with slightly different c-axis or, equivalently, the random intercalation of a small spacer in the Y123 matrix causing displacement disorder along the c-axis direction. It quantitatively reproduces both the nonmonotonous deviations of Bragg-peaks and their progressive weakening and broadening for higher diffraction orders. The model offers the possibility to evaluate both the fraction of secondary phase and its c-axis lattice parameter. In the example given, we have been able to identify 28% of intercalated hydrogen bronze H-0.66[Y123] with 4% elongated c-axis. A simplified procedure for the diagnosis and characterization of random intercalates is extracted from the model. Similar structures observed in other perovskite-based layered oxides are discussed within this framework.
引用
收藏
页码:2993 / 2996
页数:4
相关论文
共 50 条
  • [21] Comprehensive X-ray diffraction study of YBa2Cu3O7-delta thin films
    Moshfegh, AZ
    Fatollahi, AH
    Wang, YQ
    Sun, YY
    Hor, PH
    Ignatiev, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (11): : 6036 - 6040
  • [22] Elastic constant measurement in supported W/Cu multilayer thin films by X-ray diffraction
    Villain, P
    Goudeau, P
    Renault, PO
    Badawi, KF
    ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 : 791 - 796
  • [23] 200 MeV silver ion irradiation induced structural modification in YBa2Cu3O7-y thin films at 89 K: An in situ x-ray diffraction study
    Biswal, R.
    John, J.
    Mallick, P.
    Dash, B. N.
    Kulriya, P. K.
    Avasthi, D. K.
    Kanjilal, D.
    Behera, D.
    Mohanty, T.
    Raychaudhuri, P.
    Mishra, N. C.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (05)
  • [24] High-current Y-Ba-Cu-O superconducting films by metal organic chemical vapor deposition on flexible metal substrates
    Selvamanickam, V
    Galinski, GB
    Carota, G
    DeFrank, J
    Trautwein, C
    Haldar, P
    Balachandran, U
    Chudzik, M
    Coulter, JY
    Arendt, PN
    Groves, JR
    DePaula, RF
    Newnam, BE
    Peterson, DE
    PHYSICA C, 2000, 333 (3-4): : 155 - 162
  • [25] DEPOSITION OF YTTRIA-STABILIZED ZIRCONIA BUFFER LAYER ON SI AND ITS SUITABILITY FOR Y-BA-CU-O THIN-FILMS
    KATTI, VR
    GUPTA, SK
    DEBNATH, AK
    JAYDEVEN, NC
    GUPTA, LC
    GUPTA, MK
    BULLETIN OF MATERIALS SCIENCE, 1991, 14 (02) : 423 - 427
  • [26] Dielectric and X-ray Diffraction Analysis of Ba(Ga,Ta)0.05Ti0.90O3
    Mion, Thomas
    Potrepka, D. M.
    Crowne, F. J.
    Tauber, A.
    Tidrow, Steven C.
    FERROELECTRICS, 2014, 473 (01) : 13 - 23
  • [27] X-ray diffraction analysis of Zn0.85CO0.15O powder and thin films
    Qi, ZM
    Li, AX
    Su, FL
    Zhou, SM
    Liu, YM
    Zhao, ZY
    MATERIALS RESEARCH BULLETIN, 2003, 38 (14) : 1791 - 1796
  • [28] Grazing angle x-ray diffraction analysis of Pb(Zr,Ti)O3 films
    Su, T
    Trolier-McKinstry, S
    Hendrickson, M
    Zeto, RJ
    INTEGRATED THIN FILMS AND APPLICATIONS, 1998, 86 : 265 - 272
  • [29] Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2 x 2)-N/Cu(100)
    D'Addato, S.
    Borgatti, F.
    Felici, R.
    Finetti, P.
    SURFACE SCIENCE, 2012, 606 (9-10) : 813 - 819
  • [30] Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
    Nam, Dahyun
    Opanasyuk, A. S.
    Koval, P. V.
    Ponomarev, A. G.
    Jeong, Ah Reum
    Kim, Gee Yeong
    Jo, William
    Cheong, Hyeonsik
    THIN SOLID FILMS, 2014, 562 : 109 - 113