Formation of microcracks in an annealed cubic boron nitride

被引：0

作者：

Aki, M ^{[1
]}

Ohno, Y ^{[1
]}

Takeda, S ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Sci, Dept Phys, Toyonaka, Osaka 5600043, Japan

来源：

MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS | 1999年 / 164期

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have found that microcracks are formed in cubic boron nitride, grown by a hot-press method, by annealing at temperatures above 673 K. Microcracks originate from segments of 60 degrees dislocations and they extend to the dilation side of the dislocations. We have shown that the microcracks are formed by the condensation of excess nitrogen atoms onto the {111}-type atomic planes.

引用

页码：93 / 96

页数：4

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