Radiation effects in analog CMOS analog-to-digital converters

被引：4

作者：

Turflinger, TL

Davey, MV

Bings, JP

机构：

来源：

1996 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 1996年

关键词：

D O I：

10.1109/REDW.1996.574182

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and applicability to system use are discussed.

引用

页码：6 / 12

页数：7