Growth and structural analysis of thin films and epitaxial heterostructures of Pb(Zr0.52Ti0.48)O3 deposited on SrTiO3 and Al2O3 by laser ablation

被引：0

作者：

Le Marrec, F ^{[1
]}

Maréchal, C ^{[1
]}

Steinseth, RK ^{[1
]}

Karkut, MG ^{[1
]}

机构：

[1] Univ Picardie, Phys Mat Condensee Lab, F-80039 Amiens, France

来源：

VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 1998年 / 53卷 / 289期

关键词：

ferroelectric heterostructures; PZT; laser ablation; RHEED;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have successfully grown in situ, by laser ablation, the following Pb (Zr0.52Ti0.48)O-3 (PZT) based heterostructures : 1. Pb (ZT(0.52)Ti(0.48))O-3/(100) SrTiO3 (PZT/STO), 2. Pb(Zr0.52Ti0.48)O-3 / Yba(2)CuO(7) / CeO2 / (1102)Al2O3 (PZT/YBCO/CeO2/Al2O3), 3. Pb(Zr0.52Ti0.48)O-3 / Yba(2)Cu(3)O(7) / (100) SrTiO3 (PST/BCO/STO). CeO2 is used as buffer layer and YBCO as a bottom electrode. By combining RHEED (Reflection High Energy Electron Diffraction) and x-ray diffraction we have determined that : (a) all the buffer and electrode layers are atomically flat, (b) PZT grows in the 2D to 3D Stransky-Krastanov mode, (c) there is an epitaxial relationship between the in-plane axes of the layers and the substrates, (d) (d) the c-axis of PZT is perpendicular to the plane of the film.

引用

页码：601 / +

页数：8

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