Breeding Value of Primary Synthetic Wheat Genotypes for Grain Yield

被引:39
作者
Jafarzadeh, Jafar [1 ]
Bonnett, David [2 ,4 ]
Jannink, Jean-Luc [3 ]
Akdemir, Deniz [1 ]
Dreisigacker, Susanne [2 ]
Sorrells, Mark E. [1 ]
机构
[1] Cornell Univ, Dept Plant Breeding & Genet, Ithaca, NY 14850 USA
[2] CIMMYT, Int Maize & Wheat Improvement Ctr, El Batan 06600, Mexico
[3] USDA ARS, RW Holley Ctr Agr & Hlth, Ithaca, NY 14853 USA
[4] Bayer Crop Sci, Sabin, MN USA
来源
PLOS ONE | 2016年 / 11卷 / 09期
关键词
GENOMIC RELATIONSHIP MATRICES; BACKCROSS-DERIVED LINES; HEXAPLOID WHEAT; CHROMOSOMAL LOCATION; TRITICUM-TAUSCHII; BREAD WHEAT; RESISTANCE; DIVERSITY; TRAITS; POPULATION;
D O I
10.1371/journal.pone.0162860
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
To introduce new genetic diversity into the bread wheat gene pool from its progenitor, Aegi-lops tauschii (Coss.) Schmalh, 33 primary synthetic hexaploid wheat genotypes (SYN) were crossed to 20 spring bread wheat (BW) cultivars at the International Wheat and Maize Improvement Center. Modified single seed descent was used to develop 97 populations with 50 individuals per population using first back-cross, biparental, and three-way crosses. Individuals from each cross were selected for short stature, early heading, flowering and maturity, minimal lodging, and free threshing. Yield trials were conducted under irrigated, drought, and heat-stress conditions from 2011 to 2014 in Ciudad Obregon, Mexico. Genomic estimated breeding values (GEBVs) of parents and synthetic derived lines (SDLs) were estimated using a genomic best linear unbiased prediction (GBLUP) model with markers in each trial. In each environment, there were SDLs that had higher GEBVs than their recurrent BW parent for yield. The GEBVs of BW parents for yield ranged from -0.32 in heat to 1.40 in irrigated trials. The range of the SYN parent GEBVs for yield was from -2.69 in the irrigated to 0.26 in the heat trials and were mostly negative across environments. The contribution of the SYN parents to improved grain yield of the SDLs was highest under heat stress, with an average GEBV for the top 10% of the SDLs of 0.55 while the weighted average GEBV of their corresponding recurrent BW parents was 0.26. Using the pedigree-based model, the accuracy of genomic prediction for yield was 0.42, 0.43, and 0.49 in the drought, heat and irrigated trials, respectively, while for the marker-based model these values were 0.43, 0.44, and 0.55. The SYN parents introduced novel diversity into the wheat gene pool. Higher GEBVs of progenies were due to introgression and retention of some positive alleles from SYN parents.
引用
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页数:24
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