A New Intelligent Fabric Defect Detection And Classification system Based on Gabor Filter and Modified Elman Neural Network

被引:5
作者
Zhang, Y. H. [1 ]
Yuen, C. W. M. [1 ]
Wong, W. K. [1 ]
机构
[1] Hong Kong Polytech Univ, Inst Text & Clothing, Hong Kong, Hong Kong, Peoples R China
来源
2ND IEEE INTERNATIONAL CONFERENCE ON ADVANCED COMPUTER CONTROL (ICACC 2010), VOL. 2 | 2010年
关键词
fabric defect detection; classification; Gabor filter; PID; Elman neural networ; OBJECT DETECTION; INSPECTION; VISION;
D O I
10.1109/ICACC.2010.5486722
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, one fabric defect detection and classification system based on 2D Gabor wavelet transform and Elman neural network is introduced. In the proposed scheme, the texture features of the textile fabric are extracted by using an optimal 2D Gabor filter. A new modified Elman network is proposed to classify the type of fabric defects which have a proportional (P), integral (I) and derivative (D) properties. The proposed inspecting system in this study is more feasible and applicable in fabric defect detection and classification.
引用
收藏
页码:652 / 656
页数:5
相关论文
共 20 条
  • [1] Optimal Gabor filters for textile flaw detection
    Bodnarova, A
    Bennamoun, M
    Latham, S
    [J]. PATTERN RECOGNITION, 2002, 35 (12) : 2973 - 2991
  • [2] NEURAL-NET DESIGN OF MACRO GABOR WAVELET FILTERS FOR DISTORTION-INVARIANT OBJECT DETECTION IN CLUTTER
    CASASENT, DP
    SMOKELIN, JS
    [J]. OPTICAL ENGINEERING, 1994, 33 (07) : 2264 - 2271
  • [3] CHENG YC, CYBERNETICS
  • [4] M-band wavelet discrimination of natural textures
    Chitre, Y
    Dhawan, AP
    [J]. PATTERN RECOGNITION, 1999, 32 (05) : 773 - 789
  • [5] COHEN F, 1991, IEEE PAMI, V13
  • [6] DORRITY JL, 1994, REAL TIME FABRIC DEF, P193
  • [7] FINDING STRUCTURE IN TIME
    ELMAN, JL
    [J]. COGNITIVE SCIENCE, 1990, 14 (02) : 179 - 211
  • [8] Detection of local defects in textile webs using Gabor filters
    Escofet, J
    Navarro, R
    Millan, MS
    Pladellorens, J
    [J]. OPTICAL ENGINEERING, 1998, 37 (08) : 2297 - 2307
  • [9] HINZE D, 1991, IMAGE SENSOR TECHNOL, V72, P958
  • [10] KNOLL AL, 1975, INT J CLOTH SCI TECH, V10, P365