Enhancement of the quantum-liquid phase by increased resistivity in thick a-MoxSi1-x films -: art. no. 067001

被引:43
作者
Okuma, S [1 ]
Togo, S [1 ]
Morita, M [1 ]
机构
[1] Tokyo Inst Technol, Res Ctr Low Temp Phys, Meguro Ku, Tokyo 1528551, Japan
关键词
D O I
10.1103/PhysRevLett.91.067001
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Effects of normal-state resistivity rho(n) on the vortex phase diagram at low temperature T have been studied based on dc and ac complex resistivities for thick amorphous MoxSi1-x films. It is commonly observed irrespective of rho(n) that, in the limit T=0, the vortex-glass-transition line B-g(T) is independent of T and extrapolates to a field below the T=0 upper critical field B-c2(0), indicative of the quantum-vortex-liquid (QVL) phase in the regime B-g(0)<B<B-c2(0). The relative width of the QVL phase increases along the B and T axes approximately proportional to rho(n). This result is consistent with a view that the QVL phase is caused by strong quantum fluctuations, which are enhanced with increasing rho(n).
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页数:4
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