Thickness-dependent Ferroelectric Behaviors of (111)-Textured Polycrystalline Pseudo-cubic BiFeO3 Thin Films

被引：1

作者：

Choi, H. I. ^{[1
]}

Kim, S. W. ^{[1
]}

Kim, J. W. ^{[1
]}

Do, D. ^{[1
]}

Kim, S. S. ^{[1
]}

Kim, W. J. ^{[1
]}

Lee, M. H. ^{[2
]}

Park, J. S. ^{[2
]}

Cho, H. J. ^{[2
]}

Kim, D. J. ^{[2
]}

Cho, J. H. ^{[2
]}

Song, T. K. ^{[2
]}

机构：

[1] Changwon Natl Univ, Dept Phys, Chang Won 641773, South Korea

[2] Changwon Natl Univ, Sch Nano & Adv Mat Engn, Chang Won 641773, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2012年 / 60卷 / 02期

基金：

新加坡国家研究基金会;

关键词：

Pulsed laser deposition; BiFeO3; Thin film; Thickness; Ferroelectric; CHEMICAL SOLUTION DEPOSITION;

D O I：

10.3938/jkps.60.288

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Preferentially (111)-textured polycrystalline BiFeO3 (BFO) thin films with different thicknesses were deposited on Pt(111)/Ti/SiO2/Si(100) substrates by using a pulsed laser deposition method. The structure of the BFO films was found to be pseudo-cubic with a lattice constant of 3.96 angstrom based on the X-ray diffraction analysis. The (111)-textured polycrystalline BFO films exhibited good square-type P-E loops with a relatively large remnant polarization (2P(r)) of 41 similar to 54 mu C/cm(2) and a coercive field (2E(c)) of 470 similar to 510 kV/cm at an applied electric field strength of +/- 460 kV/cm. Even though the thicknesses of the films were changed, the changes in 2P(r) and 2E(c) were relatively small. The enhanced leakage current densities of the polycrystalline BFO films were observed to be at least comparable with those of other epitaxial BFO films. Furthermore, the leakage current densities of the films improved with increasing thickness.

引用

页码：288 / 291

页数：4

共 21 条

[1]

Choi EJ, 2007, J KOREAN PHYS SOC, V51, pS138, DOI 10.3938/jkps.51.138

[2] TEMPERATURE-DEPENDENCE OF THE CRYSTAL AND MAGNETIC-STRUCTURES OF BIFEO3 [J].