Noise-parameter measurement with automated variable terminations

被引：2
|
作者：
Gu, Dazhen [1 ]
Walker, David K. [1 ]
Randa, James [1 ]
机构：
[1] Natl Inst Stand & Technol, Boulder, CO USA
来源：
2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 2008年
关键词：
D O I：
10.1109/CPEM.2008.4574975
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
NIST has upgraded its measurement capability of noise parameters on low-noise amplifiers with a variable termination unit in the 1 to 12.4 GHz range. Such a unit allows improved time efficiency in the noise-temperature measurements used to de-embed noise parameters of amplifiers. We present measured results for noise parameters of a low noise amplifier in the frequency range of 8 to 12 GHz.
引用
收藏
页码：706 / 707
页数：2
相关论文
共 50 条
  • [1] Variable Termination Unit for Noise-Parameter Measurement
    Gu, Dazhen
    Walker, David K.
    Randa, James
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (04) : 1072 - 1077
  • [2] Automated Noise-Parameter Measurements of Cryogenic LNAs
    Sheldon, Alexander
    Belostotski, Leonid
    Mani, Hamdi
    Groppi, Christopher E.
    Warnick, Karl F.
    97TH ARFTG MICROWAVE MEASUREMENT CONFERENCE: CONDUCTED AND OTA MEASUREMENT CHALLENGES FOR URBAN, RURAL & SATCOMM CONNECTIVITY, 2021,
  • [3] Cryogenic Noise-Parameter Measurements: Recent Research and a Fully Automated Measurement Application
    Sheldon, Alexander
    Belostotski, Leonid
    Mani, Hamdi
    Groppi, Christopher E.
    Warnick, Karl F.
    IEEE MICROWAVE MAGAZINE, 2021, 22 (08) : 52 - 64
  • [4] Amplifier noise-parameter measurement checks and verification
    Randa, J
    Walker, DK
    ARFTG: AUTOMATIC RF TECHNIQUES GROUP, CONFERENCE DIGEST, SPRING 2004: ON WAFER CHARACTERIZATION, 2004, : 41 - 45
  • [5] Comparison of Noise-Parameter Measurement Strategies: Simulation Results for Amplifiers
    Randa, James
    2014 84TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG), 2014,
  • [6] Simulations of noise-parameter uncertainties
    Randa, J
    2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2002, : 1845 - 1848
  • [7] Verification of Noise-Parameter Measurements and Uncertainties
    Randa, James
    Dunsmore, Joel
    Gu, Dazhen
    Wong, Ken
    Walker, David K.
    Pollard, Roger D.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (11) : 3685 - 3693
  • [8] Uncertainty analysis for noise-parameter measurements
    Randa, James
    2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2008, : 498 - 499
  • [9] A new method for pHEMT noise-parameter determination based on 50-Ω noise measurement system
    Gao, JJ
    Law, CL
    Wang, H
    Aditya, S
    Boeck, G
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (10) : 2079 - 2089
  • [10] Monte Carlo estimation of noise-parameter uncertainties
    Randa, J
    Wiatr, W
    IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY, 2002, 149 (06) : 333 - 337
12345