Speckle-displacement-based wavemeter for mode-hop and side-mode detection

被引:0
作者
Jamal, Muhammad T. [1 ]
Jakobsen, Michael L. [2 ]
Hanson, Steen G. [2 ]
Hansen, Anders K. [2 ]
Jensen, Ole B. [2 ]
机构
[1] Tech Univ Denmark, Dept Hlth Technol, DK-2800 Lyngby, Denmark
[2] Tech Univ Denmark, Dept Photon Engn, Frederiksborgvej 399, DK-4000 Roskilde, Denmark
基金
欧盟地平线“2020”;
关键词
LASER-SPECKLE;
D O I
10.1364/AO.445383
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A speckle-displacement-based wavemeter is combined with a spatial-fundamental-mode-pass filter to eliminate the influence of multimode operation on the directionality of the resulting output from a distributed Bragg reflector (DBR) tapered laser. The proposed setup is characterized theoretically and experimentally, and detections of mode hops and side-mode suppression ratios (SMSRs) in the optical output are demonstrated. The laser illuminates a rough surface at an oblique angle, and a camera observes the corresponding speckle pattern from an almost identical back-scattering direction. As the wavelength of the laser shifts, the speckle pattern responds with a corresponding displacement, which is approximately linear with respect to the shift within the detection area. The wavemeter tracks continuously the shifts of the speckles pattern by tracking the peak of the covariance function of sequentially acquired images. In this way, the speckle-displacement-based wavemeter achieves a spectral resolution of 10.4 MHz. Mode hops in the laser do not cause any impeding decorrelation of the speckle patterns. Interestingly, the actual SMSR is related to the peak height and width of the absolute covariance function. A wavemeter, which is capable of measuring wavelengths, mode hops, and SMSRs, is highly useful for spectroscopy, quantum optics, nonlinear frequency conversion, and other applications requiring stable single-frequency laser light, especially when using diode lasers. (C) 2022 Optica Publishing Group
引用
收藏
页码:989 / 994
页数:6
相关论文
共 15 条
[1]   Coherent beam combining of high power quasi continuous wave tapered amplifiers [J].
Albrodt, P. ;
Niemeyer, M. ;
Crump, P. ;
Hamperl, J. ;
Moron, F. ;
Georges, P. ;
Lucas-Leclin, G. .
OPTICS EXPRESS, 2019, 27 (20) :27891-27901
[2]   Perspective on speckle spectrometers [J].
Cao, Hui .
JOURNAL OF OPTICS, 2017, 19 (06)
[3]   Speckle-based spectrometer [J].
Chakrabarti, Maumita ;
Jakobsen, Michael Linde ;
Hanson, Steen G. .
OPTICS LETTERS, 2015, 40 (14) :3264-3267
[4]   Second-harmonic-generation-based technique for examining laser diode wavelength dynamics in the μs to ms range [J].
Christensen, Mathias ;
Hansen, Anders K. ;
Noordegraaf, Danny ;
Skovgaard, Peter M. W. ;
Jensen, Ole B. .
APPLIED OPTICS, 2018, 57 (06) :1432-1436
[5]   SOME FUNDAMENTAL PROPERTIES OF SPECKLE [J].
GOODMAN, JW .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (11) :1145-1150
[6]   The dynamic speckle-based wavemeter [J].
Hanson, Steen G. ;
Jakobsen, Michael Linde ;
Chakrabarti, Maumita .
SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2018, 10834
[7]   5-W DBR Tapered Lasers Emitting at 1060 nm With a Narrow Spectral Linewidth and a Nearly Diffraction-Limited Beam Quality [J].
Hasler, K. -H. ;
Sumpf, B. ;
Adamiec, P. ;
Bugge, F. ;
Fricke, J. ;
Ressel, P. ;
Wenzel, H. ;
Erbert, G. ;
Traenkle, G. .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (17-20) :1648-1650
[8]   Speckles and their dynamics for structured target illumination: optical spatial filtering velocimetry [J].
Jakobsen, M. L. ;
Yura, H. T. ;
Hanson, S. G. .
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2009, 11 (05)
[9]   Harnessing speckle for a sub-femtometre resolved broadband wavemeter and laser stabilization [J].
Metzger, Nikolaus Klaus ;
Spesyvtsev, Roman ;
Bruce, Graham D. ;
Miller, Bill ;
Maker, Gareth T. ;
Malcolm, Graeme ;
Mazilu, Michael ;
Dholakia, Kishan .
NATURE COMMUNICATIONS, 2017, 8
[10]   Signal processing for laser-speckle strain-measurement techniques [J].
Schneider, Sebastian C. ;
Rupitsch, Stefan J. ;
Zagar, Bernhard G. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (06) :2681-2687