Efficient and fault-diagnosable authentication architecture for AMI in smart grid

被引:12
作者
Li, Depeng [1 ]
Aung, Zeyar [2 ]
Williams, John R. [3 ]
Sanchez, Abel [3 ]
机构
[1] Univ Hawaii Manoa, Honolulu, HI 96822 USA
[2] Masdar Inst Sci & Technol, Abu Dhabi, U Arab Emirates
[3] MIT, Cambridge, MA 02139 USA
关键词
authentication; digital signature; fault tolerance; fault diagnosis; smart grids; verification; SIGNATURES;
D O I
10.1002/sec.1006
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The recently emerging advanced metering infrastructure (AMI) is envisioned to be one of the most prominent features of smart grid. Security, especially authentication, is crucial for the success of large-scale AMI deployment. Unfortunately, AMI's natural requirementsefficiency, scalability, fault diagnoses, and reliabilitycannot be fully satisfied by existing authentication schemes. To validate the delay-tolerant AMI metering data, we present a new authentication architecture that boosts the utilization of a set of efficient authentication schemes. Meanwhile, in case of authentication failures, fault diagnoses are highly demanded by AMI. Thus, we develop a few corresponding fault diagnosis algorithms that precisely pinpoint the authentication failure with lightweight computational cost. We implement our system on emulated smart meters and commodity servers. Experimental results on real-world scenarios demonstrate the feasibility of our system; it merely incurs substantially lighter overheads than those by the existing schemes, while it can effectively address the formidable authentication challenges in AMI. Copyright (c) 2014 John Wiley & Sons, Ltd.
引用
收藏
页码:598 / 616
页数:19
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