Q-Factor Change of Cavity by Sample Installation in Resonance Perturbation Method

被引：0

作者：

Miura, Taro ^{[1
]}

Tahara, Ken ^{[2
]}

Sugiyama, Jun-ichi ^{[3
]}

Horibe, Masahiro ^{[3
]}

机构：

[1] Mueller Consultant, Tokyo, Japan

[2] Kanto Elect Applicat & Dev, Kanto, Japan

[3] Natl Inst Adv Ind Sci & Technol, Tokyo, Japan

来源：

2015 45TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2015年

关键词：

Resonance cavity perturbation methods; Q-factor; Dielectric materials; Permittivity; Loss measurement;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In the measuring process of the cavity resonance perturbation method to evaluate permittivity, it has historically been supposed that Q-factor of the cavity itself is not affected by the installation of a sample since the method has been proposed. Recently, several experimental results to show the change of Q-factor by the installation of a sample were found. Measurements and discussions to confirm the change have been made and a method to obtain the intrinsic loss factor of the sample separated from Q-factor change of the cavity is proposed in this paper.

引用

页码：738 / 741

页数：4

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