The Cryogenic Transient Current Technique (C-TCT) measurement setup of CERN RD39 Collaboration

被引:16
作者
Harkonen, J. [1 ]
Eremin, V.
Verbitskaya, E.
Czellar, S.
Pusa, P.
Li, Z.
Niinikoski, T. O.
机构
[1] CERN, EP 40 4A 002, CH-1211 Geneva, Switzerland
[2] Univ Helsinki, Helsinki Inst Phys, FIN-00014 Helsinki, Finland
[3] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[4] Univ Helsinki, Accelerator Lab, FIN-00014 Helsinki, Finland
[5] Brookhaven Natl Lab, Upton, NY 11973 USA
基金
芬兰科学院;
关键词
D O I
10.1016/j.nima.2007.08.001
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The CERN RD39 Collaboration has constructed a Transient Current Technique (TCT) measurement setup, which is capable to operate below liquid nitrogen temperatures. By analyzing the current transients, it is possible to extract the full depletion voltage, effective trapping time, electric field distribution and the sign of the space charge in the silicon bulk. Our results show that the effective space charge and trapping can be manipulated by charge injection and temperature. This might allow significantly higher Charge Collection Efficiency (CCE) compared to the detectors operating under normal reverse bias and at temperatures from 0 to -30 degrees C. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:347 / 350
页数:4
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