A Methodology for Combined Modeling of Skin, Proximity, Edge, and Surface Roughness Effects

被引：34

作者：

Curran, Brian ^{[1
]}

Ndip, Ivan ^{[1
,2
]}

Guttowski, Stephan ^{[1
,2
]}

Reichl, Herbert ^{[1
,2
]}

机构：

[1] Fraunhofer Inst Reliabil & Microintegrat IZM, D-13355 Berlin, Germany

[2] Tech Univ Berlin, Sch Elect Engn & Comp Sci, D-10623 Berlin, Germany

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2010年 / 58卷 / 09期

关键词：

Conductor modeling; edge effects; surface roughness; transmission line; CONDUCTOR LOSS; LINES; SHAPE; MICROSTRIP;

D O I：

10.1109/TMTT.2010.2058271

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A methodology is introduced for modeling resistive losses in planar transmission lines that support the transverse electromagnetic mode. The methodology aims to accurately and systematically account for these losses by modeling the skin, proximity, edge, and surface roughness effects in a combined way. The results show a correlation with three measurements within 5%, and offer insight into the different sources of resistive losses at high frequencies. Considering a printed coplanar line as an example, approximately 8% of the resistive loss come from surface roughness, and 30% from the edge effects at 60 GHz. However, for a line with a higher conductivity metallization, this increases to 38% and 30%, respectively, from surface roughness and edge effects at only 20 GHz.

引用

页码：2448 / 2455

页数：8

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