A New Calibration Method for Backscatter Signal in a Side Beam X-ray Detection System

被引:0
作者
Chen, JiaMin [1 ]
Li, Weijiao [1 ]
Shen, Tianming [1 ]
Chang, Qingqing
机构
[1] Minist Publ Secur, Res Inst 3, Shanghai, Peoples R China
来源
ELECTRONICS, MECHATRONICS AND AUTOMATION III | 2014年 / 666卷
关键词
side beam; X-ray backscatter; detector response; non-uniform; calibration;
D O I
10.4028/www.scientific.net/AMM.666.288
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
This paper shows a method to calibrating the non-uniformity of the x-ray backscatter image in a side-beam x-ray detection system. The flying spot of x-ray beam cross the luggage under detection per cycle, and every point of the detector being irradiated by flying spot can be taken as an assumed detector. Using calibrators of different thickness and combined with the corresponding mathematical model, the greyscale of the image is uniformed and calibration is achieved.
引用
收藏
页码:288 / +
页数:2
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