Accurate assembly and size control of cu nanoparticles into nanowires by contact atomic force microscope-based nanopositioning

被引：5
作者：
Yang, De-Quan
Sacher, Edward
机构：
[1] Ecole Polytech, Regrp Quebecois Mat Pointe, Montreal, PQ H3C 3A7, Canada
[2] Ecole Polytech, Dept Genie Phys, Montreal, PQ H3C 3A7, Canada
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2007年 / 111卷 / 27期
关键词：
D O I：
10.1021/jp071998o
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Cu nanowires have been assembled from deposited nanoparticles at designated positions on Dow Cyclotene substrates, using a unidirectional sweeping action of atomic force microscope tips in contact mode. The nanowires are of controllable heights and widths, and adhere strongly to the substrate. These nanowires can be cut to desired lengths by unidirectionally sweeping the atomic force microscope tip across them.
引用
收藏
页码：10105 / 10109
页数：5
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