Avrami exponent of crystallization in tellurite glasses

被引:14
作者
Sidel, S. M. [1 ,2 ]
Santos, F. A. [1 ]
Gordo, V. O. [1 ]
Idalgo, E. [1 ]
Monteiro, A. A. [1 ]
Moraes, J. C. S. [1 ]
Yukimitu, K. [1 ]
机构
[1] UNESP Univ Estadual Paulista, Fac Engn, Ilha Solteira, SP, Brazil
[2] UFT Univ Fed Tocantins, Palmas, TO, Brazil
关键词
Tellurite glasses; Nucleation; Crystallization; Activation energy; XRD; DSC; NONISOTHERMAL CRYSTALLIZATION; 20LI(2)O-80TEO(2) GLASS; CHALCOGENIDE GLASSES; ACTIVATION-ENERGY; CRYSTAL-STRUCTURE; THERMAL-ANALYSIS; KINETICS; NUCLEATION; TEMPERATURE; GROWTH;
D O I
10.1007/s10973-011-1312-4
中图分类号
O414.1 [热力学];
学科分类号
摘要
Nucleation process and crystal growth for three samples of the (20-x)Li(2)O-80TeO(2)-xWO(3) glass system were studied using X-ray diffraction and differential scanning calorimetry techniques. X-ray diffraction data confirmed the amorphous characteristic of the as-quenched samples and indicated the growth of crystalline phases formed due to the thermal treatment for annealed samples. These results reveal the presence of three distinct gamma-TeO(2), alpha-TeO(2) and alpha-Li(2)Te(2)O(5) crystalline phases in the TL sample, and two distinct alpha-TeO(2) and gamma-TeO(2) crystalline phases in the TLW5 and TLW10 samples. The activation energy and the Avrami exponent were determined from DSC measurements. The activation energy values X-ray diffraction data of the TLW10 glass sample suggest that gamma-TeO(2) phase occur before the alpha-TeO(2). The results obtained for the Avrami exponent point to that the nucleation process is volumetric and that the crystal growth is two or three-dimensional.
引用
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页码:613 / 618
页数:6
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