Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

被引：43

作者：

Killgore, Jason P. ^{[1
]}

Geiss, Roy H. ^{[1
]}

Hurley, Donna C. ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Div Mat Reliabil, Boulder, CO 80305 USA

来源：

SMALL | 2011年 / 7卷 / 08期

关键词：

NANOSCALE WEAR; STIFFNESS;

D O I：

10.1002/smll.201002116

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Contact resonance force microscopy is used during AFM scanning to resolve instantaneous and progressive nanometer-scale changes in the contact radius between an AFM tip and a silicon substrate. High-resolution quantitative measurements of contact radius reveal real-time information on wear rate, fracture, and tip-symmetry. © 2011 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：1018 / 1022

页数：5

共 32 条

[1] An energy-based model to predict wear in nanocrystalline diamond atomic force microscopy tips [J].

Agrawal, R. ;

Moldovan, N. ;

Espinosa, H. D. .

JOURNAL OF APPLIED PHYSICS, 2009, 106 (06)

[2]

Bhaskaran H, 2010, NAT NANOTECHNOL, V5, P181, DOI [10.1038/NNANO.2010.3, 10.1038/nnano.2010.3]

[3] Force measurements with the atomic force microscope: Technique, interpretation and applications [J].

Butt, HJ ;

Cappella, B ;

Kappl, M .

SURFACE SCIENCE REPORTS, 2005, 59 (1-6) :1-152

[4] Scratching the surface: Fundamental investigations of tribology with atomic force microscopy [J].

Carpick, RW ;

Salmeron, M .

CHEMICAL REVIEWS, 1997, 97 (04) :1163-1194

[5] Fundamental investigation of micro wear rate using an atomic force microscope [J].

Chung, KH ;

Kim, DE .

TRIBOLOGY LETTERS, 2003, 15 (02) :135-144

[6] Advances in atomic force microscopy [J].

Giessibl, FJ .

REVIEWS OF MODERN PHYSICS, 2003, 75 (03) :949-983

[7] Atomistic wear in a single asperity sliding contact [J].

Gotsmann, Bernd ;

Lantz, Mark A. .

PHYSICAL REVIEW LETTERS, 2008, 101 (12)

[8] Structured Polymer Brushes by AFM Lithography [J].

Hirtz, Michael ;

Brinks, Marion K. ;

Miele, Soskia ;

Studer, Armido ;

Fuchs, Harald ;

Chi, Lifeng .

SMALL, 2009, 5 (08) :919-923

[9]

Hurley DC, 2009, NANOSCI TECHNOL, P97, DOI 10.1007/978-3-540-85037-3_5

[10] The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale [J].

Jesse, Stephen ;

Kalinin, Sergei V. ;

Proksch, Roger ;

Baddorf, A. P. ;

Rodriguez, B. J. .

NANOTECHNOLOGY, 2007, 18 (43)

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