Silicon-Based Single Quantum Dot Emission in the Telecoms C-Band

被引:9
|
作者
Orchard, Jonathan R. [1 ]
Woodhead, Chris [2 ]
Wu, Jiang [3 ]
Tang, Mingchu [3 ]
Beanland, Richard [4 ]
Noori, Yasir [2 ]
Liu, Huiyun [3 ]
Young, Robert J. [2 ]
Mowbray, David J. [1 ]
机构
[1] Univ Sheffield, Dept Phys, Hicks Bldg,Hounsfield Rd, Sheffield S3 7RH, S Yorkshire, England
[2] Univ Lancaster, Dept Phys, Lancaster LA1 4YB, England
[3] UCL, Dept Elect & Elect Engn, Torrington Pl, London WC1E 7JE, England
[4] Univ Warwick, Dept Phys, Gibbet Hill Rd, Coventry CV4 7AL, W Midlands, England
来源
ACS PHOTONICS | 2017年 / 4卷 / 07期
基金
英国工程与自然科学研究理事会;
关键词
single-photon sources; quantum dots; Si substrate; C-band; III-V semiconductors; GaAsSb; WAVELENGTH LIGHT-EMISSION; MU-M; GAASSB; LASERS; LAYERS; INGAAS; DEVICE;
D O I
10.1021/acsphotonics.7b00276
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report the observation of single quantum dot (QD) emission in the telecoms C-band (1530-1565 nm) from an InAs QD structure grown on a Si substrate. A large red-shift of the emission is achieved by capping InAs QDs with a thin GaAsSb layer. Sharp lines, representing emission from single QDs, are observed out to wavelengths as long as 1540 nm. Comparison is made to the optical properties of a nominally identical active region structure grown on a GaAs substrate. Single QD emission from a Si-based system at 1500 nm has the potential for single photon sources compatible with current optical fibers and reduced complexity of integration with drive electronics.
引用
收藏
页码:1740 / 1746
页数:7
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