Elastic characterization of orthotropic plates of any shape via static testing

被引：30

作者：

Bruno, Luigi ^{[1
]}

Felice, Giuseppina ^{[1
]}

Pagnotta, Leonardo ^{[1
]}

Poggialini, Andrea ^{[1
]}

Stigliano, Giambattista ^{[1
]}

机构：

[1] Univ Calabria, Dept Mech Engn, I-87030 Commenda Di Rende, Italy

来源：

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES | 2008年 / 45卷 / 3-4期

关键词：

isotropic materials; orthotropic materials; elastic constants; speckle interferometry; finite element analysis (FEA); genetic algorithms; non-destructive testing (NDT); ANISOTROPIC PLATES; CONSTANTS; IDENTIFICATION; PARAMETERS;

D O I：

10.1016/j.ijsolstr.2007.09.017

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

The paper presents an inverse procedure for identifying elastic properties of isotropic or orthotropic materials from the full-field measurement of the surface displacements of plates under flexural loading configurations. The procedure is based on a numerical-experimental optimisation process which minimizes an error function defined by subtracting the experimental data from the outputs of the numerical analysis. In each iteration the optimisation process updates the values of the elastic constants in a finite element model of the specimen used in the experimental tests. The unknown parameters are simultaneously identified by a single test and without damaging the structural integrity of the specimen. The possibility of using the methodology for characterizing any-shaped plates was investigated. The applicability and the robustness of the procedure were carried out on aluminum and unidirectional Graphite/PEEK laminate specimens. Phase-shifting speckle interferometry was employed to detect the out-of-plane displacement field of a portion of the observed surface of the specimen. (c) 2007 Elsevier Ltd. All rights reserved.

引用

页码：908 / 920

页数：13

共 36 条

[1]

[Anonymous], 2004, Int. J. Mech. Mater. Des., DOI DOI 10.1007/S10999-004-1731-5

[2]

ARCHBOLD E, 1978, VDI BER, V313, P517

[3] Elastic characterization of CVD diamond by static and dynamic measurements [J].