Applications of NAA, PIXE and XPS for the quantification and characterization of the humic substances/iodine association

被引：23

作者：

Mercier, F ^{[1
]}

Moulin, V

Guittet, MJ

Barré, N

Toulhoat, N

Gautier-Soyer, M

Toulhoat, P

机构：

[1] Univ Evry Val Essonne, UMR Anal & Environm 8587, CEA, CNRS,Ctr Etudes Saclay, F-91191 Gif Sur Yvette, France

[2] Ctr Etud Saclay, DESD, DCC, CEA, F-91191 Gif Sur Yvette, France

[3] Ctr Etud Saclay, DRECAM, DSM, CEA, F-91191 Gif Sur Yvette, France

来源：

RADIOCHIMICA ACTA | 2000年 / 88卷 / 9-11期

关键词：

humic substances; iodine; chemical environment; XPS; NAA; PIXE;

D O I：

10.1524/ract.2000.88.9-11.779

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

This paper illustrates the coupling of Neutron Activation Analysis (NAA), Proton Induced X-ray Emission (PIXE) and X-ray Photoelectron Spectroscopy (XPS) to quantify iodine contents in natural humic substances from different geochemical origins and to determine its chemical environment. Non negligible contents of iodine from some hundreds of mug/g to more than one weight per cent have been quantified in the humic substances, and iodine seems to be attached to the organic matter by covalent bonds.

引用

页码：779 / 785

页数：7