Characterization of CdTe:Cl crystals grown under microgravity conditions by time dependent charge measurements (TDCM)

被引:11
作者
Eiche, C [1 ]
Joerger, W [1 ]
Fiederle, M [1 ]
Ebling, D [1 ]
Salk, M [1 ]
Schwarz, R [1 ]
Benz, KW [1 ]
机构
[1] UNIV FREIBURG,FREIBURGER MAT FORSCHUNGSZENTRUM,D-79104 FREIBURG,GERMANY
关键词
D O I
10.1016/0022-0248(96)00071-1
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
CdTe:Cl crystals were grown from the liquid and from the vapour phase under microgravity( mu g) conditions on board the unmanned EURECA I mission. The resistivity distribution of the grown crystals was measured by time dependent charge measurement (TDCM). Photo induced current transient spectroscopy (PICTS) was used to investigate the deep level properties. The axial resistivity distributions of the crystals grown in space differ significantly from Ig reference crystals. In the case of vapour growth, these differences can be explained by an additional laminar flow under Ig conditions. Supercooling has to be considered in growth from a Te zone under mu g.
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页码:245 / 250
页数:6
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